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"Characterization of Random Process Variations Using Ultralow-Power, ..."

Mesut Meterelliyoz et al. (2010)

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DOI: 10.1109/TCSI.2009.2037449

access: closed

type: Journal Article

metadata version: 2020-05-22

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Mesut Meterelliyoz, Peilin Song, Franco Stellari, Jaydeep P. Kulkarni, Kaushik Roy:
Characterization of Random Process Variations Using Ultralow-Power, High-Sensitivity, Bias-Free Sub-Threshold Process Sensor. IEEE Trans. Circuits Syst. I Regul. Pap. 57-I(8): 1838-1847 (2010)

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