"Novel Process and Temperature-Stable, IDD Sensor for the BIST Design of ..."

John C. Liobe, Martin Margala (2007)

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DOI: 10.1109/TCSI.2007.904653

access: closed

type: Journal Article

metadata version: 2025-05-31

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John C. Liobe, Martin Margala:
Novel Process and Temperature-Stable, IDD Sensor for the BIST Design of Embedded Digital, Analog, and Mixed-Signal Circuits. IEEE Trans. Circuits Syst. I Regul. Pap. 54-I(9): 1900-1915 (2007)

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