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"Code-width testing-based compact ADC BIST circuit."
Dongmyung Lee et al. (2004)
- Dongmyung Lee, Kwisung Yoo, Kicheol Kim, Gunhee Han, Sungho Kang:
Code-width testing-based compact ADC BIST circuit. IEEE Trans. Circuits Syst. II Express Briefs 51-II(11): 603-606 (2004)
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