"An SRAM Reliability Test Macro for Fully Automated Statistical ..."

Tony Tae-Hyoung Kim, Wei Zhang, Chris H. Kim (2012)

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DOI: 10.1109/TCSI.2011.2167264

access: closed

type: Journal Article

metadata version: 2020-05-22

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Tony Tae-Hyoung Kim, Wei Zhang, Chris H. Kim:
An SRAM Reliability Test Macro for Fully Automated Statistical Measurements of V_MIN Degradation. IEEE Trans. Circuits Syst. I Regul. Pap. 59-I(3): 584-593 (2012)

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