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"Efficient ECSM Characterization Considering Voltage, Temperature, and ..."

Baljit Kaur et al. (2014)

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DOI: 10.1109/TCSI.2014.2336511

access: closed

type: Journal Article

metadata version: 2022-10-02

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Baljit Kaur, Naushad Alam, S. K. Manhas, Bulusu Anand:
Efficient ECSM Characterization Considering Voltage, Temperature, and Mechanical Stress Variability. IEEE Trans. Circuits Syst. I Regul. Pap. 61-I(12): 3407-3415 (2014)

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