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"On Diagnosing the Aging Level of Automotive Semiconductor Devices."

Jihun Jung et al. (2017)

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DOI: 10.1109/TCSII.2016.2601959

access: closed

type: Journal Article

metadata version: 2020-05-27

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  - journals/tcas/JungAKYP17
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  - https://dblp.org/rec/journals/tcas/JungAKYP17
Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park:
On Diagnosing the Aging Level of Automotive Semiconductor Devices. IEEE Trans. Circuits Syst. II Express Briefs 64-II(7): 822-826 (2017)

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