"Novel Low-Power and Highly Reliable Radiation Hardened Memory Cell for 65 ..."

Jing Guo, Liyi Xiao, Zhigang Mao (2014)

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DOI: 10.1109/TCSI.2014.2304658

access: closed

type: Journal Article

metadata version: 2020-05-22

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Jing Guo, Liyi Xiao, Zhigang Mao:
Novel Low-Power and Highly Reliable Radiation Hardened Memory Cell for 65 nm CMOS Technology. IEEE Trans. Circuits Syst. I Regul. Pap. 61-I(7): 1994-2001 (2014)

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