"Hybrid K-Means Clustering and Support Vector Machine Method for via and ..."

Deruo Cheng et al. (2018)

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DOI: 10.1109/TCSII.2018.2827044

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type: Journal Article

metadata version: 2023-03-27

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Deruo Cheng, Yiqiong Shi, Tong Lin, Bah-Hwee Gwee, Kar-Ann Toh:
Hybrid K-Means Clustering and Support Vector Machine Method for via and Metal Line Detections in Delayered IC Images. IEEE Trans. Circuits Syst. II Express Briefs 65-II(12): 1849-1853 (2018)

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