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"USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model ..."

Tao Chen et al. (2018)

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DOI: 10.1109/TCSI.2017.2775632

access: closed

type: Journal Article

metadata version: 2022-07-26

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Tao Chen, Xiankun Jin, Randall L. Geiger, Degang Chen:
USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test. IEEE Trans. Circuits Syst. I Regul. Pap. 65-I(7): 2059-2069 (2018)

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