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"Multi-Level Design Influences on Robustness Evaluation of 7nm FinFET ..."
Leonardo Heitich Brendler et al. (2020)
- Leonardo Heitich Brendler
, Alexandra L. Zimpeck, Cristina Meinhardt
, Ricardo Augusto da Luz Reis
:
Multi-Level Design Influences on Robustness Evaluation of 7nm FinFET Technology. IEEE Trans. Circuits Syst. I Regul. Pap. 67-I(2): 553-564 (2020)
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