"Analog IC Design in Ultra-Thin Oxide CMOS Technologies With Significant ..."

Eric Bohannon, Clyde Washburn, Ponnathpur R. Mukund (2011)

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DOI: 10.1109/TCSI.2010.2089550

access: closed

type: Journal Article

metadata version: 2020-05-22

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Eric Bohannon, Clyde Washburn, Ponnathpur R. Mukund:
Analog IC Design in Ultra-Thin Oxide CMOS Technologies With Significant Direct Tunneling-Induced Gate Current. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(4): 645-653 (2011)

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