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"Expected Value and Variance of the Indirect Time-of-Flight Measurement ..."
Maik Beer et al. (2018)
- Maik Beer, Olaf M. Schrey, Bedrich J. Hosticka, Rainer Kokozinski:
Expected Value and Variance of the Indirect Time-of-Flight Measurement With Dead Time Afflicted Single-Photon Avalanche Diodes. IEEE Trans. Circuits Syst. I Regul. Pap. 65-I(3): 970-981 (2018)
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