"Verification of timed circuits with failure-directed abstractions."

Hao Zheng et al. (2006)

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DOI: 10.1109/TCAD.2005.854638

access: closed

type: Journal Article

metadata version: 2020-09-24

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Hao Zheng, Chris J. Myers, David Walter, Scott Little, Tomohiro Yoneda:
Verification of timed circuits with failure-directed abstractions. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(3): 403-412 (2006)

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