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"Hot-Trim: Thermal and Reliability Management for Commercial Multicore ..."

Jinwei Zhang, Sheriff Sadiqbatcha, Sheldon X.-D. Tan (2023)

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DOI: 10.1109/TCAD.2022.3216552

access: closed

type: Journal Article

metadata version: 2023-07-07

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Jinwei Zhang, Sheriff Sadiqbatcha, Sheldon X.-D. Tan:
Hot-Trim: Thermal and Reliability Management for Commercial Multicore Processors Considering Workload Dependent Hot Spots. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(7): 2290-2302 (2023)

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