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"Stochastic Testing Method for Transistor-Level Uncertainty Quantification ..."

Zheng Zhang et al. (2013)

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DOI: 10.1109/TCAD.2013.2263039

access: closed

type: Journal Article

metadata version: 2022-01-03

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Zheng Zhang, Tarek A. El-Moselhy, Ibrahim M. Elfadel, Luca Daniel:
Stochastic Testing Method for Transistor-Level Uncertainty Quantification Based on Generalized Polynomial Chaos. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(10): 1533-1545 (2013)

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