"Voltage-Aware Chip-Level Design for Reliability-Driven Pin-Constrained ..."

Sheng-Han Yeh et al. (2014)

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DOI: 10.1109/TCAD.2014.2331340

access: closed

type: Journal Article

metadata version: 2020-09-24

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Sheng-Han Yeh, Jia-Wen Chang, Tsung-Wei Huang, Shang-Tsung Yu, Tsung-Yi Ho:
Voltage-Aware Chip-Level Design for Reliability-Driven Pin-Constrained EWOD Chips. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(9): 1302-1315 (2014)

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