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"Secure Scan: A Design-for-Test Architecture for Crypto Chips."

Bo Yang, Kaijie Wu, Ramesh Karri (2006)

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DOI: 10.1109/TCAD.2005.862745

access: closed

type: Journal Article

metadata version: 2020-09-24

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Bo Yang, Kaijie Wu, Ramesh Karri:
Secure Scan: A Design-for-Test Architecture for Crypto Chips. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(10): 2287-2293 (2006)

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