"Post-Silicon Failing-Path Isolation Incorporating the Effects of Process ..."

Lin Xie, Azadeh Davoodi (2012)

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DOI: 10.1109/TCAD.2012.2187206

access: closed

type: Journal Article

metadata version: 2020-09-24

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Lin Xie, Azadeh Davoodi:
Post-Silicon Failing-Path Isolation Incorporating the Effects of Process Variations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(7): 1008-1018 (2012)

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