"Fast Physics-Based Electromigration Analysis for Full-Chip Networks by ..."

Xiaoyi Wang et al. (2021)

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DOI: 10.1109/TCAD.2020.3001264

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type: Journal Article

metadata version: 2023-12-19

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Xiaoyi Wang, Shaobin Ma, Sheldon X.-D. Tan, Chase Cook, Liang Chen, Jianlei Yang, Wenjian Yu:
Fast Physics-Based Electromigration Analysis for Full-Chip Networks by Efficient Eigenfunction-Based Solution. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(3): 507-520 (2021)

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