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"An Automatic Test Pattern Generation Method for Multiple Stuck-At Faults ..."

Peikun Wang, Amir Masoud Gharehbaghi, Masahiro Fujita (2020)

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DOI: 10.1109/TCAD.2019.2957364

access: closed

type: Journal Article

metadata version: 2020-10-06

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Peikun Wang, Amir Masoud Gharehbaghi, Masahiro Fujita:
An Automatic Test Pattern Generation Method for Multiple Stuck-At Faults by Incrementally Extending the Test Patterns. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10): 2990-2999 (2020)

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