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"Specification-driven test generation for analog circuits."

Pramodchandran N. Variyam, Abhijit Chatterjee (2000)

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DOI: 10.1109/43.875320

access: closed

type: Journal Article

metadata version: 2020-09-24

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Pramodchandran N. Variyam, Abhijit Chatterjee:
Specification-driven test generation for analog circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(10): 1189-1201 (2000)

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