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"Simulation-Based Diagnostic Model for Automatic Testability Analysis of ..."

Xiaofeng Tang et al. (2018)

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DOI: 10.1109/TCAD.2017.2762647

access: closed

type: Journal Article

metadata version: 2020-09-24

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Xiaofeng Tang, Aiqiang Xu, Ruifeng Li, Min Zhu, Jinling Dai:
Simulation-Based Diagnostic Model for Automatic Testability Analysis of Analog Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(7): 1483-1493 (2018)

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