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"Easily testable gate-level and DCVS multipliers."
Andres R. Takach, Niraj K. Jha (1991)
- Andres R. Takach, Niraj K. Jha:
Easily testable gate-level and DCVS multipliers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 10(7): 932-942 (1991)
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