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"Nonlinear decision boundaries for testing analog circuits."

Haralampos-G. D. Stratigopoulos, Yiorgos Makris (2005)

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DOI: 10.1109/TCAD.2005.855835

access: closed

type: Journal Article

metadata version: 2021-04-09

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Haralampos-G. D. Stratigopoulos, Yiorgos Makris:
Nonlinear decision boundaries for testing analog circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(11): 1760-1773 (2005)

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