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"Conditionally robust two-pattern tests and CMOS design for testability."

Sunil D. Sherlekar, P. S. Subramanian (1988)

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DOI: 10.1109/43.3165

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/SherlekarS88
Sunil D. Sherlekar, P. S. Subramanian:
Conditionally robust two-pattern tests and CMOS design for testability. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7(3): 325-332 (1988)

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