"Test and Yield Loss Reduction of AI and Deep Learning Accelerators."

Mehdi Sadi, Ujjwal Guin (2022)

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DOI: 10.1109/TCAD.2021.3051841

access: closed

type: Journal Article

metadata version: 2022-01-08

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Mehdi Sadi, Ujjwal Guin:
Test and Yield Loss Reduction of AI and Deep Learning Accelerators. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(1): 104-115 (2022)

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