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"Robust Compact Model of High-Voltage MOSFET's Drift Region."

Girish Pahwa et al. (2023)

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DOI: 10.1109/TCAD.2022.3172599

access: closed

type: Journal Article

metadata version: 2023-09-30

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  - https://dblp.org/rec/journals/tcad/PahwaSGGACH23
Girish Pahwa, Ayushi Sharma, Ravi Goel, Garima Gill, Harshit Agarwal, Yogesh Singh Chauhan, Chenming Hu:
Robust Compact Model of High-Voltage MOSFET's Drift Region. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(1): 337-340 (2023)

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