"Using Abstraction to Guide the Search for Long Error Traces."

Kuntal Nanshi, Fabio Somenzi (2013)

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DOI: 10.1109/TCAD.2012.2228266

access: closed

type: Journal Article

metadata version: 2020-09-24

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Kuntal Nanshi, Fabio Somenzi:
Using Abstraction to Guide the Search for Long Error Traces. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(3): 453-466 (2013)

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