Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Accurate estimation of total leakage in nanometer-scale bulk CMOS circuits ..."

Saibal Mukhopadhyay, Arijit Raychowdhury, Kaushik Roy (2005)

> Home

Details and statistics

DOI: 10.1109/TCAD.2004.842810

access: closed

type: Journal Article

metadata version: 2020-09-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/MukhopadhyayRR05
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/MukhopadhyayRR05
Saibal Mukhopadhyay, Arijit Raychowdhury, Kaushik Roy:
Accurate estimation of total leakage in nanometer-scale bulk CMOS circuits based on device geometry and doping profile. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(3): 363-381 (2005)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.