"Accurate estimation of total leakage in nanometer-scale bulk CMOS circuits ..."

Saibal Mukhopadhyay, Arijit Raychowdhury, Kaushik Roy (2005)

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DOI: 10.1109/TCAD.2004.842810

access: closed

type: Journal Article

metadata version: 2020-09-24

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Saibal Mukhopadhyay, Arijit Raychowdhury, Kaushik Roy:
Accurate estimation of total leakage in nanometer-scale bulk CMOS circuits based on device geometry and doping profile. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(3): 363-381 (2005)

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