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"X-Masking for Deterministic In-System Tests."

Grzegorz Mrugalski et al. (2023)

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DOI: 10.1109/TCAD.2023.3261781

access: closed

type: Journal Article

metadata version: 2023-11-09

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  - https://dblp.org/rec/journals/tcad/MrugalskiRTW23
Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer, Bartosz Wlodarczak:
X-Masking for Deterministic In-System Tests. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(11): 4260-4269 (2023)

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