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"A Data Base Driven Automated System for MOS Device Characterization, ..."

O. Melstrand et al. (1984)

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DOI: 10.1109/TCAD.1984.1270056

access: closed

type: Journal Article

metadata version: 2020-09-24

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O. Melstrand, Eamonn O'Neill, Gerald E. Sobelman, D. Dokos:
A Data Base Driven Automated System for MOS Device Characterization, Parameter Optimization and Modeling. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 3(1): 47-51 (1984)

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