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"A Data Base Driven Automated System for MOS Device Characterization, ..."
O. Melstrand et al. (1984)
- O. Melstrand, Eamonn O'Neill, Gerald E. Sobelman, D. Dokos:
A Data Base Driven Automated System for MOS Device Characterization, Parameter Optimization and Modeling. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 3(1): 47-51 (1984)
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