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"Synergistic Reliability and Yield Enhancement Techniques for Embedded SRAMs."

Shyue-Kung Lu et al. (2013)

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DOI: 10.1109/TCAD.2012.2210420

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/LuHHN13
Shyue-Kung Lu, Huan-Hua Huang, Jiun-Lang Huang, Pony Ning:
Synergistic Reliability and Yield Enhancement Techniques for Embedded SRAMs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(1): 165-169 (2013)

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