default search action
"Statistical Test Development for Analog Circuits Under High Process ..."
Fang Liu, Sule Ozev (2007)
- Fang Liu, Sule Ozev:
Statistical Test Development for Analog Circuits Under High Process Variations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(8): 1465-1477 (2007)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.