"Statistical Test Development for Analog Circuits Under High Process ..."

Fang Liu, Sule Ozev (2007)

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DOI: 10.1109/TCAD.2007.891373

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type: Journal Article

metadata version: 2020-09-24

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Fang Liu, Sule Ozev:
Statistical Test Development for Analog Circuits Under High Process Variations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(8): 1465-1477 (2007)

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