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"A Comprehensive Evaluation of Integrated Circuits Side-Channel Resilience ..."
Yanjiang Liu et al. (2022)
- Yanjiang Liu
, Jiaji He
, Haocheng Ma
, Tongzhou Qu, Zibin Dai:
A Comprehensive Evaluation of Integrated Circuits Side-Channel Resilience Utilizing Three-Independent-Gate Silicon Nanowire Field Effect Transistors-Based Current Mode Logic. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(10): 3228-3238 (2022)
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