"Satisfiability-based test generation for nonseparable RTL ..."

Loganathan Lingappan, Srivaths Ravi, Niraj K. Jha (2006)

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DOI: 10.1109/TCAD.2005.853700

access: closed

type: Journal Article

metadata version: 2020-09-24

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Loganathan Lingappan, Srivaths Ravi, Niraj K. Jha:
Satisfiability-based test generation for nonseparable RTL controller-datapath circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(3): 544-557 (2006)

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