"Efficient Design for Testability Solution Based on Unsatisfiability for ..."

Loganathan Lingappan, Niraj K. Jha (2007)

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DOI: 10.1109/TCAD.2006.888268

access: closed

type: Journal Article

metadata version: 2020-09-24

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Loganathan Lingappan, Niraj K. Jha:
Efficient Design for Testability Solution Based on Unsatisfiability for Register-Transfer Level Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(7): 1339-1345 (2007)

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