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"Testing content-addressable memories using functional fault modelsand ..."

Kun-Jin Lin, Cheng-Wen Wu (2000)

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DOI: 10.1109/43.845082

access: closed

type: Journal Article

metadata version: 2023-09-30

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Kun-Jin Lin, Cheng-Wen Wu:
Testing content-addressable memories using functional fault modelsand march-like algorithms. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(5): 577-588 (2000)

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