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"A Novel Test Method for Metallic CNTs in CNFET-Based SRAMs."

Tianjian Li et al. (2016)

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DOI: 10.1109/TCAD.2015.2512909

access: closed

type: Journal Article

metadata version: 2023-03-21

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  - https://dblp.org/rec/journals/tcad/LiXLXCJJ16
Tianjian Li, Feng Xie, Xiaoyao Liang, Qiang Xu, Krishnendu Chakrabarty, Naifeng Jing, Li Jiang:
A Novel Test Method for Metallic CNTs in CNFET-Based SRAMs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(7): 1192-1205 (2016)

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