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"Test Response Compaction via Output Bit Selection."
Kuen-Jong Lee, Wei-Cheng Lien, Tong-Yu Hsieh (2011)
- Kuen-Jong Lee, Wei-Cheng Lien, Tong-Yu Hsieh:
Test Response Compaction via Output Bit Selection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(10): 1534-1544 (2011)
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