"Static leakage reduction through simultaneous Vt/Tox ..."

Dongwoo Lee, David T. Blaauw, Dennis Sylvester (2005)

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DOI: 10.1109/TCAD.2005.847906

access: closed

type: Journal Article

metadata version: 2021-07-28

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Dongwoo Lee, David T. Blaauw, Dennis Sylvester:
Static leakage reduction through simultaneous V_t/T_ox and state assignment. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(7): 1014-1029 (2005)

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