"Accelerated and Reliable Analog Circuits Yield Analysis Using SMT Solving ..."

Ons Lahiouel, Mohamed H. Zaki, Sofiène Tahar (2018)

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DOI: 10.1109/TCAD.2017.2651807

access: closed

type: Journal Article

metadata version: 2020-09-24

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Ons Lahiouel, Mohamed H. Zaki, Sofiène Tahar:
Accelerated and Reliable Analog Circuits Yield Analysis Using SMT Solving Techniques. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(3): 517-530 (2018)

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