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"Reliability Analysis of Multiple-Outputs Logic Circuits Based on Structure ..."

Miroslav Kvassay et al. (2017)

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DOI: 10.1109/TCAD.2016.2586444

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/KvassayZLK17
Miroslav Kvassay, Elena Zaitseva, Vitaly G. Levashenko, Jozef Kostolny:
Reliability Analysis of Multiple-Outputs Logic Circuits Based on Structure Function Approach. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(3): 398-411 (2017)

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