"Voltage- and current-based fault simulation for interconnect open defects."

Haluk Konuk (1999)

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DOI: 10.1109/43.811326

access: closed

type: Journal Article

metadata version: 2020-09-24

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Haluk Konuk:
Voltage- and current-based fault simulation for interconnect open defects. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(12): 1768-1779 (1999)

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