"OATT: Outlier-Oriented Alternative Testing and Post-Manufacture Tuning of ..."

Suhasini Komarraju et al. (2025)

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DOI: 10.1109/TCAD.2025.3549353

access: closed

type: Journal Article

metadata version: 2025-10-15

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Suhasini Komarraju, Akhil Tammana, Chandramouli N. Amarnath, Abhijit Chatterjee:
OATT: Outlier-Oriented Alternative Testing and Post-Manufacture Tuning of Analog/Mixed-Signal Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 44(10): 3668-3682 (2025)

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