"Bayesian Learning-Enhanced Embedded Memory Design With Automated Circuit ..."

Dongho Kim et al. (2025)

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DOI: 10.1109/TCAD.2025.3531337

access: closed

type: Journal Article

metadata version: 2025-08-09

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Dongho Kim, Junseo Lee, Seokhun Kim, Jihwan Park, Sangheon Lee, Hanwool Jeong:
Bayesian Learning-Enhanced Embedded Memory Design With Automated Circuit Variant Generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 44(8): 3099-3111 (2025)

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