"Three-dimensional defect sensitivity modeling for open circuits in ULSI ..."

M. K. Kidambi et al. (1998)

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DOI: 10.1109/43.703826

access: closed

type: Journal Article

metadata version: 2020-09-24

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M. K. Kidambi, Akhilesh Tyagi, Mohammed R. Madani, Magdy A. Bayoumi:
Three-dimensional defect sensitivity modeling for open circuits in ULSI structures. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17(4): 366-371 (1998)

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