"LBIST for Automotive ICs With Enhanced Test Generation."

Bartosz Kaczmarek et al. (2022)

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DOI: 10.1109/TCAD.2021.3100741

access: closed

type: Journal Article

metadata version: 2022-06-28

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Bartosz Kaczmarek, Grzegorz Mrugalski, Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Lukasz Rybak, Jerzy Tyszer:
LBIST for Automotive ICs With Enhanced Test Generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(7): 2290-2300 (2022)

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