"Rapid Assessment of Design Sensitivity to Process Excursions via Scaled ..."

Srinivas Jallepalli et al. (2016)

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DOI: 10.1109/TCAD.2016.2523445

access: closed

type: Journal Article

metadata version: 2020-09-24

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Srinivas Jallepalli, Ram Mooraka, Sanjay Parihar, Earl Hunter, Elie Maalouf:
Rapid Assessment of Design Sensitivity to Process Excursions via Scaled Sigma Sampling. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(6): 957-970 (2016)

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