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"Diagnosing arbitrary defects in logic designs using single location at a ..."

Leendert M. Huisman (2004)

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DOI: 10.1109/TCAD.2003.816206

access: closed

type: Journal Article

metadata version: 2020-09-24

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Leendert M. Huisman:
Diagnosing arbitrary defects in logic designs using single location at a time (SLAT). IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(1): 91-101 (2004)

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