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"Programmable Leakage Test and Binning for TSVs With Self-Timed Timing Control."
Shi-Yu Huang et al. (2013)
- Shi-Yu Huang, Yu-Hsiang Lin, Li-Ren Huang, Kun-Han Tsai, Wu-Tung Cheng:
Programmable Leakage Test and Binning for TSVs With Self-Timed Timing Control. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(8): 1265-1273 (2013)
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