"Programmable Leakage Test and Binning for TSVs With Self-Timed Timing Control."

Shi-Yu Huang et al. (2013)

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DOI: 10.1109/TCAD.2013.2252056

access: closed

type: Journal Article

metadata version: 2020-09-24

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Shi-Yu Huang, Yu-Hsiang Lin, Li-Ren Huang, Kun-Han Tsai, Wu-Tung Cheng:
Programmable Leakage Test and Binning for TSVs With Self-Timed Timing Control. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(8): 1265-1273 (2013)

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